Abhisek Dixit, Electrical Engineering, IIT Delhi

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This semester

Nothing recorded this semester.

Earlier

ELP7342
On-Wafer Device Characterization Laboratory.
3 (0-0-6) credits · Sem 2, 2025-26
unrated
ELP740
On-wafer Device Characterization Laboratory
3 (0-0-6) credits · Sem 2, 2025-26, Sem 2, 2024-25
unrated
ELL7342
SPICE-PDK Compact Device Models for Silicon IC Design Simulations
3 (3-0-0) credits · Sem 1, 2025-26
unrated
ELL740
Compact Modeling of Semiconductor Devicesrunning now
3 (3-0-0) credits · Sem 1, 2025-26, Sem 1, 2024-25, Sem 1, 2023-24
unrated
ELP101
Introduction to Electrical Engineering (Laboratory)
1 (0-0-2) credits · Sem 1, 2024-25
unrated
JVD811
Major Project-Irunning now
12 (0-0-24) credits · Sem 1, 2024-25, Sem 2, 2023-24, Sem 1, 2023-24
unrated
JVD895
MS Research Projectrunning now
36 (0-0-72) credits · Sem 1, 2024-25, Sem 2, 2023-24, Sem 1, 2023-24, Sem 2, 2022-23
unrated
ELP833
Device and Materials Characterization Laboratory
3 (0-0-6) credits · Sem 2, 2023-24
unrated
JVD812
Major Project-II
12 (0-0-24) credits · Sem 2, 2023-24, Sem 2, 2022-23
unrated
ELL304
Analog Electronicsrunning now
5.5 (3-1-3) credits · Sem 1, 2023-24
unrated

Each course has its own page and discussion.

Doing a BTP, MTP, PhD, internship or RA position under Dixit, scored on five separate axes.

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Mentorship5

1 · left yourself to itclosely guided · 10

Availability5

1 · weeks to get a replyresponds same day · 10

Freedom5

1 · told exactly what to dopicked my own direction · 10

Workload5

1 · lightpunishing · 10

Credit5

1 · contribution went unacknowledgedscrupulously fair on authorship · 10

These are deliberately not all “high is good”. Someone who wants heavy guidance and someone who wants total autonomy are looking for opposite ends of the Freedom axis. Answer honestly about what it was like; readers will judge fit.

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Areas listed by the department

Modeling and characterization of Silicon-based qubitsCMOS at cryogenic temperatures for quantum computationRF-CMOS devices and circuitsReliability of CMOSGaN-HEMT devicesRadiation effects in CMOS

Publications, via OpenAlex

23h-index

2187Citations

137Works

50i10

Topic clusters

Advancements in Semiconductor Devices and Circuit DesignSemiconductor materials and devicesLow-power high-performance VLSI designSilicon Carbide Semiconductor TechnologiesRadio Frequency Integrated Circuit Design

Most recent

Enhanced power performance and threshold voltage stability in quaternary InAlGaN/GaN MIS-HEMTs on Si with gate field plate · Discover Electronics, 2026
A Review of TDDB Reliability in 45-nm PDSOI FETs: Effects of Cryogenic Operation, AC Stress, and Layout Variations · IEEE Transactions on Electron Devices, 2026
Semi-Empirical Modeling of Hot Carrier Degradation in 12-nm FinFET LDMOS Devices · IEEE Transactions on Device and Materials Reliability, 2026 · 1 citations
Impact of Back-Bias on Analog Performance at Cryogenic Temperature in 22-nm FDSOI MOSFETs for Quantum Computing Applications · IEEE Journal of the Electron Devices Society, 2026
Cryogenic-Temperature Aware Compact Modeling of 12 nm n-FinFETs Using BSIM-CMG for custom PDK Enablement and Quantum Applications · IEEE International Conference on Emerging Electronics (ICEE), 2025

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